On this day: May 12
2 records from this date, 2025 to 2026, gathered year by year — the most recent year first.
2026
This year · 1 recordMartin and Roger publish Classifier Context RotSam Martin, Fabien Roger
Empirical evidence that long-context limits also break down safety monitoring performance
2025
1 year ago · 1 recordUniversity of Padua compares anomaly detection on integrated circuit SEM imagesUniversity of Padua (Barusco, Dalle Pezze, Susto et al.)
99% image-level AUROC with zero defect labels. A public comparative experiment showing that, for OSAT, where defect classes change often, a design that skips the defect-collection stage entirely holds up in the SEM domai